National Instruments RF and microwave seminars
National Instruments will hold a series of free, full-day, RF and microwave test and design seminars to educate and update engineers, researchers and technicians on technological advances in the test and design of microwave and RF systems.
Through various presentations, experts will explore the functionality and capabilities of new technologies that are changing the way RF test and design applications - including RF record and playback, radar, MIMO and spectrum monitoring - are being approached. Additionally, attendees will explore the architecture and advantages of software-defined, modular instrumentation, as well as learn about key considerations, time-saving tips and advanced testing techniques.
Featured sessions will be:
- Revolutionising RF and microwave test and design with a modular approach
- Advanced technologies for RF record, playback and MIMO applications
- Design flow with AWR Microwave Office
- Advanced VNA measurements
- Linking RF design, simulation and test for radar applications
- Introduction to spectrum monitoring receivers
The event is free to attend and is designed for RF and microwave engineers and scientists involved in all phases of the product life cycle - from design and verification to production and field test.
The seminars will be held in five capital cities on the following dates:
- Sydney - 5 March
- Canberra - 6 March
- Auckland - 12 March
- Adelaide - 18 March
- Melbourne - 20 March
Admission is free but spaces are limited. For more details, visit australia.ni.com/events/rfroadshow.
TCCA to host sixth annual CCBitesize webinar for Australasian CC sector
The Australasian Critical Communications Forum chapter of the TCCA will host its sixth annual...
WA Government commits $6.5m in funding to local space research
Funds will be distributed over the next four years with a total of $4 million awarded to...
CSIRO testing quantum entanglement to secure GNSS timing
CSIRO researchers have developed a field-ready platform that can be deployed to optical...
