Test system could accelerate manufacturing

Thursday, 04 October, 2007

Agilent Technologies and GCT Semiconductor have announced plans to implement a WiMAX manufacturing test system for GCT's WiMAX chipsets, which will accelerate manufacturing throughput and allow mass production deployment.

Agilent will support GCT chipsets with its E6651A Mobile WiMAX Test Set and MXZ-1000 WiMAX Manufacturing Test System.

The initial chipset supported will be for 2.3 GHz wave 1 mobile WiMAX products, consisting of GCT's GDM7201S baseband chip and the GRF7201 RF chip, and will be followed by mass deployment of 2.5 GHz wave 2 mobile WiMAX chipsets.

The Mobile WiMAX Test Set, equipped with its Wireless Test Manager and automation software package, can be used to calibrate and verify performance of GCT-based devices and to test many aspects of functionality such as network entry.

The MXZ-1000 WiMAX Manufacturing Test System, which now offers the GCT chipset library, is designed to directly control GCT chipsets and enables the highest possible measurement throughput.

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