LTE collaboration
Altair Semiconductor and Aeroflex have formed a joint long-term evolution (LTE) collaboration.
The two firms will perform interoperability testing to enable joint user development and testing on a pre-tested and qualified user equipment test set-up. Altair has ordered multiple 7100 LTE digital radio test sets from Aeroflex.
For several months, the companies have collaborated on interoperability testing of their products - Aeroflex’s 7100 digital radio test set and Altair’s FourGee LTE USB ExpressCard UE.
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