Aeroflex SMART^E 5300 general-purpose DC to 40 GHz device

Aeroflex has introduced the SMART^E 5300, a general-purpose DC to 40 GHz device that tests, monitors and controls any device under test within a single test environment.

It eliminates a large rack of test equipment and replaces it with a compact test system that is quickly reconfigured and redeployed to suit any individual DUT or production line. It can also emulate legacy and obsolete instruments.

The device is designed for parametric and functional testing in the military/aerospace and high-performance commercial markets. The system is suitable for users requiring high throughput production; a large number of unique tests per DUT; highly repetitive tests per DUT; product lines requiring rapid software reconfiguration of test systems; replacement of racks of older or obsolete equipment with a ‘synthetic’ or software-defined test environment.

It is also claimed to be the ultimate in flexible testing for general-purpose RF/microwave parametric and functional testing. Its many features reduce complexity and result in extending the life cycle of test environments.

With open system architecture and an intuitive interface, users can write and program new tests and test sequences; third-party modules and instruments are added easily, while system-level software allows integration; complete software measurement libraries allow quick set-up for turnkey functional and parametric testing; system-level calibration ensures that all modules and instruments are fully integrated and perform accurate, coherent and repetitive, NIST traceable measurements right up to the interface of the DUT; diagnostic software allows local and remote troubleshooting to the module or instrument level; all hardware modules and interfaces are based on widely used industry standards including PXI, LXI, cPCI and Ethernet.