National Instruments Wireless Test System

The National Instruments Wireless Test System (WTS) combines advances in PXI hardware to offer a single platform for multi-standard, multi-DUT and multi-port testing. When used with flexible test sequencing software, such as the TestStand Wireless Test Module, manufacturers can significantly improve instrument utilisation when testing multiple devices in parallel.

The WTS integrates into a manufacturing line with ready-to-run test sequences for devices that use chipsets from suppliers such as Qualcomm and Broadcom, as well as integrated DUT and remote automation control.

With support for wireless standards from LTE Advanced to 802.11ac to Bluetooth Low Energy, the WTS is designed for manufacturing test of WLAN access points, cellular handsets, infotainment systems and other multi-standard devices that include cellular, wireless connectivity and navigation standards. Software-designed PXI vector signal transceiver technology inside the WTS delivers good RF performance in the manufacturing test environment and a platform that can scale with the evolving requirements of RF test.